Pedro Arrazola, Mondragon University, Spain
Helmi Attia, McGill University, Canada
Dirk Biermann, TU Dortmund, Germany
Fritz Bleicher, Vienna University of Technology, Austria
Christian Brecher, RWTH Aachen University, Germany
Alessandra Caggiano, Roma Tre University, Italy
Marcello Colledani, Politecnico di Milano, Italy
Berend Denkena, Leibniz Universitaet Hannover, Germany
Klaus Droeder, TU Braunschweig, Germany
Welf G. Drossel, Fraunhofer IWU, Germany
Eleonora Ferraris, KU Leuven, Belgium
Jürgen Fleischer, Karlsruhe Institute of Technology, Germany
Robert Gao, Case Western Reserve University, USA
Norbert Geier, Budapest University of Technology and Economics, Hungary
Robert Heinemann, The University of Manchester, UK
Wolfgang Hintze, Hamburg University of Technology, Germany
André Hürkamp, TU Braunschweig, Germany
Steffen Ihlenfeldt, Fraunhofer IWU, Germany
Ibrahim S. Jawahir, University of Kentucky, USA
Yasuhiro Kakinuma, Keio University, Japan
Yigit Karpat, Turkey
Kevin Kerrigan, University of Sheffield, UK
Gisela Lanza, Karlsruhe Institute of Technology, Germany
Rocco Lupoi, Trinity College Dublin, Ireland
Adelaide Marzano, Edinburgh Napier University, UK
Paul Mativenga, The University of Manchester, UK
Shreyes Melkote, Georgia Institute of Technology, USA
Rachid M’Saoubi, Seco Tools AB & Lund University, Sweden
Christian Möhring, University of Stuttgart, Germany
Dimitris Mourtzis, University of Patras, Greece
Luigi Nele, University of Naples Federico II, Italy
Stephen Newman, University of Bath, UK
Garret O’Donnell, Trinity College Dublin, Ireland
Jose Outeiro, The University of North Carolina at Charlotte, USA
Nicolas Perry, Arts et Métiers ParisTech, France
Gerard Poulachon, Arts et Métiers ParisTech Cluny, France
Paolo Priarone, Politecnico di Torino, Italy
Luca Romoli, University of Pisa, Italy
Volker Schulze, Karlsruhe Institute of Technology, Germany
Luca Settineri, Politecnico di Torino, Italy
Jamal Y. Sheikh-Ahmad, Western New England University, USA
Islam Shyha, Edinburgh Napier University, UK
Alessandro Simeone, Politecnico di Torino, Italy
Scott Smith, Oak Ridge National Laboratory, USA
Roberto Teti, University of Naples Federico II, Italy
Sharifu Ura, Kitami Institute of Technology, Japan
Gregory W. Vogl, National Institute of Standards and Technology, USA
Konrad Wegener, ETH Zurich, Switzerland
Rafi Wertheim, Fraunhofer IWU, Israel
Michael Zaeh, TU Munich, Germany